7 article(s) from Wirtz, Tom
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
- Eduardo Serralta,
- Nico Klingner,
- Olivier De Castro,
- Michael Mousley,
- Santhana Eswara,
- Serge Duarte Pinto,
- Tom Wirtz and
- Gregor Hlawacek
Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
- Michael Mousley,
- Santhana Eswara,
- Olivier De Castro,
- Olivier Bouton,
- Nico Klingner,
- Christoph T. Koch,
- Gregor Hlawacek and
- Tom Wirtz
Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160
Defect formation in multiwalled carbon nanotubes under low-energy He and Ne ion irradiation
- Santhana Eswara,
- Jean-Nicolas Audinot,
- Brahime El Adib,
- Maël Guennou,
- Tom Wirtz and
- Patrick Philipp
Beilstein J. Nanotechnol. 2018, 9, 1951–1963, doi:10.3762/bjnano.9.186
Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy
- Patrick Philipp,
- Lukasz Rzeznik and
- Tom Wirtz
Beilstein J. Nanotechnol. 2016, 7, 1749–1760, doi:10.3762/bjnano.7.168
Nanoanalytics for materials science
- Thilo Glatzel and
- Tom Wirtz
Beilstein J. Nanotechnol. 2016, 7, 1674–1675, doi:10.3762/bjnano.7.159
Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy
- Lukasz Rzeznik,
- Yves Fleming,
- Tom Wirtz and
- Patrick Philipp
Beilstein J. Nanotechnol. 2016, 7, 1113–1128, doi:10.3762/bjnano.7.104
High sensitivity and high resolution element 3D analysis by a combined SIMS–SPM instrument
- Yves Fleming and
- Tom Wirtz
Beilstein J. Nanotechnol. 2015, 6, 1091–1099, doi:10.3762/bjnano.6.110
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